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4H HPSI SICOI Wafer


OMedaSemi develop 4-6 inch SICOI wafers (silicon carbide on insulator wafers). The wafers use Direct Bonding(hydropholic bonding) or surface activated bonding technology to bond thermal oxide wafers and 4H high-purity semi-insulating silicon carbide wafers together, and then control the thickness to the thickness you need through ion implantation, annealing, thinning or direct thinning and CMP polishing. It is worth noting that ion implantation and direct CMP and thinning have their own advantages and disadvantages.


6inch 4H HPSI SiCOI wafer 

We have successfully developed the SICOI with the following two method, if you do not have sepcial requirements ,we will use direct bonding process.generally for MEMS&PIC&Quantum application,direct bonding is the best choice.  

Bonding Method_1 --Hydropholic Bonding (Direct bonding)

Bonding Method_2 --Surface Actived Bonding(room temperature bonding with modified layer)

Different from conventional , we also have  Surface Actived Bonding Technology. During bonding, a modified layer is added in the middle to match the upper and lower bonding surfaces. The material of the modified layer is generally amorphous silicon/aluminum oxide/titanium oxide. For optical applications, we recommend aluminum oxide or titanium oxide. Users can choose different intermediate layers according to their needs. This bonding method can effectively avoid bubbles during the bonding process. For mass-produced products, according to our specifications, we promise a minimum of 79.8% of the available area of 6-inch wafers.



We have successfully developed the SICOI with the smartcut(high precise thickness uniformity, damage to sic crystal ) and Grinding&CMP process(not so high precise thickness uniformity of sic film ,no any damage to sic film)

For thick film(over 900nm) and PIC&Quantum application ,we recommend the Grinding&CMP process, because there are ion implantation process in SMARTCUT process, the ion implantation process will cause damage to the SIC crystal and influence the performance of SICOI device .

For other application who do not care so much about the crystal micro quality and have strict demands of thickness uniformity ,we recommend the smartcut process


Film thickness range and accuracy

Based on SMARTCUT process

Film thickness range: 50nm-900nm(900nm is at most ,1000um SIC film is easily broken)

Film thickness uniformity +-20nm

Based on Grinding+CMP process

Film thickness range: 350nm-500um

Film thickness uniformity: +-100nm:

Data support(N K Value of 4H HPSI SiC):

N and K value of  4H HPSI Silicon Carbide .xlsx


Standar Specification 

Grinding-CMP fabricated 6 inch SiCOI

High-purity semi-insulating 4H-SiC, on-axis, Orientation: {0001} ±0.25 deg, thickness: 1um±0.1um;

SiO2 thickness 3um,Si (100) 675+-25um

SiC C-face up, roughness Rq<0.2nm (5um*5um)after CMP 

 1000nm HPSI SIC on 3um SIO2 and 675um Si 2024.9.25.pdf

 700nm HPSI SIC on 3um SIO2 and 675um Si 2024.9.25 (2).pdf

 500nm HPSI SIC on 3um SIO2 and 675um Si 2024.9.25 (2).pdf

Test Data(as you can see in this drawing , we get a 6 inch SICOI wafer its thickness uniformity is 1um+-100nm and its average surface roughness is 0.118nm )

More Test Report(Thickness UniformityRa,TTV,BOW,WRAP)  that we have done before 

 700nmSICOI Test Report.xlsx

 500nmSICOI Test Report.xlsx

 1000nmSICOI Test Report.pdf


SmartCut VS Direct Thining&CMP Polishing

SmartCut Process can provide excellent film thickness accuracy, but the ion implantation process will have a certain impact on the silicon carbide material, which will affect the device performance when used in optical applications. 





Grinding and CMP polishing will not damage the material properties and can provide good device performance, but this method cannot well control the thickness accuracy of the silicon carbide layer.


OMedaSemi can provide SICOI wafer based on both Smartcut and thinning and polishing processes.

Application:

SICOI Based MEMS Sensor 

See related article :

4H silicon carbide bulk acoustic wave gyroscope with ultra-high Q-factor for on-chip inertial navigation.pdf

4H-Silicon_Carbide_as_an_Acoustic_Material_for_MEMS.pdf

SICOI Based Photonics Integrated Circuit

See related article :

Wafer-scale 4H-silicon carbide-on-insulator (4H–SiCOI) platform for nonlinear integrated.pdf

Nonlinear Integrated 4H-SiC-on-Insulator Platform.pdf


* Development of deep etching process based on SICOI wafer

Nano Precision Deep Reactive Ion Etching of Monocrystalline 4H-SiCOI for Bulk Acoustic Wave Resonators with Ultra Low Dissipation.pdf






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About Us

OMeda (Shanghai Omedasemi Co.,Ltd) was founded in 2021 by 3 doctors with more than 10 years of experience in nanpfabrication. It currently has 15 employees and has rich experience in nanofabrication (coating, lithography, etching, two-photon printing, bonding) and other processes. We support nanofabrication of 4/6/8-inch wafers.

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